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MSM X-ray Facility




Bruker D8 Advance diffractometer with divergent beam optics, 9 position sample changer with sample rotation and a position sensitive detector. Ideal for quick phase identification.



Incident beam: divergent beam optics with CuKα1,2 radiation in line focus used in reflection mode with a fixed anti-scatter knife-edge.

Secondary beam: graphite monochromator can be used with scintillation counter.

Auto and manual absorbers can be used. Most slits are motorized.



Single point scintillation detector, or LynxEye position sensitive detector.



  • 0.0001° minimum step in source and detector
  • ~0.04° best resolution in ω
  • ~0.08° best resolution in 2θ