B3 - Bruker D8 Advance
Overview
Bruker D8 Advance diffractometer with an automatic sample changer (6 magazines, 15 samples per magazine), a position sensitive detector with good energy resolution, and sample rotation. Ideal for high quality powder diffraction data.
Optics
Incident beam: divergent beam optics in reflection mode with CuKα1,2 radiation in line focus.
A moving anti-scatter knife edge gives a cleaner background at low angles.
All slits motorized, and automatic recognition of components such as absorbers and masks.
Detector
LynxEye EX position sensitive detector with ~6.5% energy resolution.
Resolution
- 0.0001° minimum step in source and detector
- ~0.03° best resolution in ω
- ~0.06° best resolution in 2θ
Training videos
There is a short video for researchers wishing to use B3 for their research. This video gives a brief tour of the instrument and its operation and is intended for researchers who wish to familiarise themselves with the instrument prior to getting formally trained to use it as well as existing users who wish to refresh their knowledge.
There are also four videos that show how to prepare samples for analysis in B1 and B3 using different preparation methods:
- PXRD sample mounting 01, thin film sample preparation – 1 min 49 sec
- PXRD sample mounting 02, sample preparation using a low background silicon sample holder with cavity – 4 min 9 sec
- PXRD sample mounting 03, sample preparation on a plain low background flat silicon wafer using solvent to fix sample – 5 min 6 sec
- PXRD sample mounting 04, sample preparation on a plain low background flat silicon wafer using grease to fix sample – 3 min 12 sec