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MSM X-ray Facility

 

 

 

Overview

Philips PW 1820 diffractometer. Ideal for measuring large powder samples. Sample rotation is also available if required.

 


Optics

Incident beam: divergent beam optics in reflection mode with CuKα1,2 radiation in line focus.

Secondary beam: graphite monochromator gives good energy resolution but low intensity.

All slits etc. are manual.

 


Detector

Single-point proportional detector.

 


Resolution

  • 0.005° minimum step in ω
  • 0.01° minimum step in 2θ
  • ~0.04° best resolution in ω
  • ~0.09° best resolution in 2θ